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UL 61010B-2-031
M00062711
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UL 61010B-2-031 Electrical Equipment for Measurement, Control, and Laboratory Use; Part 2: Particular Requirements for Hand-Held Probe Assemblies for Electrical Measurement and Test
standard by Underwriters Laboratories, 06/25/2003
Full Description
Electrical Equipment for Measurement, Control, and Laboratory Use; Part 2: Particular Requirements for Hand-Held Probe Assemblies for Electrical Measurement and TestUL 61010B-2-031
1 Scope and object
This clause of part 1 is applicable, except as follows:
1.1 Scope
Replacement:This International Standard applies to hand-held and hand-manipulated PROBE ASSEMBLIES of the types described below, and related accessories. These PROBE ASSEMBLIES are for use in the interface between an electrical phenomenon and a measuring or test instrument. They may be stand-alone PROBE ASSEMBLIES which are themselves within the scope of part 1, or accessories to other equipment within the scope of part 1.
a) Low-voltage and high-voltage, non-attenuating PROBE ASSEMBLIES (type A).
Non-attenuating PROBE ASSEMBLIES for direct connection to voltages not exceeding 63 kV r.m.s. or d.c. They do not incorporate active components, nor are they intended to provide a voltage divider function or a signal conditioning function, but they may contain passive non-attenuating components such as fuses.
b) High-voltage attenuating or divider PROBE ASSEMBLIES (type B).
Attenuating or divider PROBE ASSEMBLIES for direct connection to voltages exceeding 1 kV r.m.s. or d.c. but not exceeding 63 kV r.m.s. or d.c. The divider function may be carried out wholly within the PROBE ASSEMBLY, or partly in the test or measuring equipment intended to be used with the PROBE ASSEMBLY.
c) Low-voltage attenuating or divider PROBE ASSEMBLIES (type C).
Attenuating, divider or other signal conditioning PROBE ASSEMBLIES for direct connection to voltages exceeding 30 V r.m.s. or 42,4 V peak or 60 V d.c., but not exceeding 1 kV r.m.s., peak or d.c. The signal conditioning function may be carried out wholly within the PROBE ASSEMBLY, or partly within the test or measuring equipment intended to be used with the PROBE ASSEMBLY.
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