ISO 13424:2013 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results of thin-film analysis

standard by International Organization for Standardization, 10/01/2013

Full Description

ISO 13424:2013 specifies the minimum amount of information required in reports of analyses of thin films on a substrate by XPS. These analyses involve measurement of the chemical composition and thickness of homogeneous thin films, and measurement of the chemical composition as a function of depth of inhomogeneous thin films by angle-resolved XPS, XPS sputter-depth profiling, peak-shape analysis, and variable photon energy XPS.