ESD TR5.4-01-00 Transient Induced Latch-Up (TLU)

standard by EOS/ESD Association, Inc., 2000

Full Description

This report provides a brief background on early latch-up work, reviews the issues surrounding the power supply response requirements, and discusses the efforts on RLC TLU testing, transmission line pulse (TLP) stressing, and the new bi-polar stress TLU methodology.

Product Details

Published: 2000 Number of Pages: 29 File Size: 1 file , 730 KB