ESD SP5.5.2-2007 Electrostatic Discharge Sensitivity Testing - Very Fast Transmission Line Pulse (VF-TLP) - Component Level

standard by EOS/ESD Association, Inc., 2007

Full Description

This document pertains to Very Fast Transmission Line Pulse (VF-TLP) testing techniques of semiconductor components. It establishes guidelines and standard practices presently used by development, research and reliability engineers in both universities and industry for VF-TLP testing. This document explains a methodology for both testing and reporting information associated with VF-TLP testing.

Product Details

Published: 2007 ISBN(s): 1585371440 ANSI: ANSI Approved Number of Pages: 38