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ESD SP5.3.2-2008

M00000186

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ESD SP5.3.2-2008 Sensitivity Testing Socketed Device (SDM) Component Level

standard by EOS/ESD Association, Inc., 2008

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Reaffirmation of ANSI/ESD SP5.3.2-2004

This standard practice provides a test method for generating a "Socketed Device Model" (SDM) test on a component integrated circuit (IC) device.

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