Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
New
Reduced price!
View larger
View larger
ESD SP5.4.1-2017
M00001750
New product
ESD SP5.4.1-2017 For Latch-up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits Transient Latch-up Testing Device Level
standard by EOS/ESD Association, Inc., 2018
Full Description
ESD SP5.4.1-2017 defines procedures to characterize the latch-up sensitivity of integrated circuits triggered by fast transients.In stock