X9 X9.100-30-2011 (R2017) Optical Background Measurement for MICR Documents

standard by Accredited Standards Committee X9 Incorporated, 08/09/2011

Full Description

ANSI X9.100-30-2011 (R2017) is the specification of the optical measurement methodology for the parameters of reflectance, PCS, DCR, Paxel Count, and opacity which are needed for MICR documents.

Product Details

Published: 08/09/2011 ANSI: ANSI Approved Number of Pages: 35 File Size: 1 file , 770 KB